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1

A computer controlled low energy electron diffractometer for surface crystallography

VE de Carvalho, MW Cook, PG Cowell, OS Heavens, M Prutton, SP Tear

Journal:

Year:

1984

Language:

english

File:

PDF, 521 KB

english, 1984

2

Unconstrained optimization in LEED: application to Ge(111) (1 × 1) - H

SP Tear, PG Cowell

Journal:

Year:

1988

Language:

english

File:

PDF, 194 KB

english, 1988

3

LEED I(V) analysis and STM of the Si(111)-Pb system

AH Jones, H Zhao, SP Tear

Journal:

Year:

1995

Language:

english

File:

PDF, 153 KB

english, 1995

4

Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis

El-Gomati, MM, Walker, CGH, Bonet, C, Tear, SP, Matthew, JAD

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 173 KB

english, 2008

5

Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal

Bonet, C, Pratt, A, El-Gomati, M, Matthew, JAD, Tear, SP

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 547 KB

english, 2008

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